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Dynamic Profiler
4D Technology "NanoCam Sq"

NanoCam Sq

Feature

Feature

Dynamic Interferometry

Measurement principle

4D Technology "Dynamic" laser interferometers use proprietary, high speed, high resolution wavefront sensors to measure the shape of optical surfaces with extreme accuracy.

In a conventional phase-shifting laser interferometer, multiple frames of data are acquired over many milliseconds—enough time for vibration and turbulence to degrade the measurement results. In a dynamic interferometer, all phase data is acquired simultaneously, in as little as 30μsec. This speed enables 4D dynamic interferometers to measure in noisy environments, despite vibration solation or air turbulence.

Dynamic interferometry® enables complex tests between multiple unisolated tables, measurements in environmental chambers, and measurements with long stand-off distances. Odd shapes, pupil obscurations, poor signal contrast, moving parts, air turbulence and mechanical vibration are not problems. Special wavefront sensors have also been developed for wavelength insensitivity, higher spatial resolution, and applications within tight space restrictions.

"4Sight™" Data Analysis Software

4Sight

4Sight™ data analysis software sets the standard for easy and accurate analysis of data from laser interferometers and other metrology systems.

Microsoft Windows interface, open data file format, extensive 2D and 3D displays, filtering, data masking, fiducial alignment, diffraction analysis and much more.
With simple data exchange capability you can read and analyze data from almost any analysis package.

4Sight™ functions with virtually any phase shifting interferometer, as a stand alone workstation, and, of course, as the heart of 4D dynamic laser interferometers.